BosioDGTVMW11'

@inproceedings{DBLP:conf/ats/BosioDGTVMW11,
  author    = {Alberto Bosio and
               Luigi Dilillo and
               Patrick Girard and
               Aida Todri and
               Arnaud Virazel and
               Kohei Miyase and
               X. Wen},
  title     = {Power-Aware Test Pattern Generation for At-Speed LOS Testing},
  booktitle = {Asian Test Symposium},
  year      = {2011},
  pages     = {506-510},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.50},
  crossref  = {DBLP:conf/ats/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2011,
  title     = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011,
               New Delhi, India, November 20-23, 2011},
  booktitle = {ATS},
  publisher = {IEEE Computer Society},
  year      = {2011},
  isbn      = {978-1-4577-1984-4},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6114262},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}