BibTeX record conf/ats/BensoBCNP06a

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@inproceedings{DBLP:conf/ats/BensoBCNP06a,
  author       = {Alfredo Benso and
                  Alberto Bosio and
                  Stefano Di Carlo and
                  Giorgio Di Natale and
                  Paolo Prinetto},
  title        = {{ATPG} for Dynamic Burn-In Test in Full-Scan Circuits},
  booktitle    = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
                  2006},
  pages        = {75--82},
  publisher    = {{IEEE}},
  year         = {2006},
  url          = {https://doi.org/10.1109/ATS.2006.260996},
  doi          = {10.1109/ATS.2006.260996},
  timestamp    = {Tue, 07 May 2024 20:12:45 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/BensoBCNP06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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