BibTeX record conf/ats/BaiHWCCLCL13

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@inproceedings{DBLP:conf/ats/BaiHWCCLCL13,
  author       = {Bing{-}Chuan Bai and
                  Chun{-}Lung Hsu and
                  Ming{-}Hsueh Wu and
                  Chen{-}An Chen and
                  Yee{-}Wen Chen and
                  Kun{-}Lun Luo and
                  Liang{-}Chia Cheng and
                  James Chien{-}Mo Li},
  title        = {Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile {SRAM}},
  booktitle    = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
                  18-21, 2013},
  pages        = {123--127},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/ATS.2013.32},
  doi          = {10.1109/ATS.2013.32},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/BaiHWCCLCL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}