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BibTeX record conf/ats/BagweP00
@inproceedings{DBLP:conf/ats/BagweP00, author = {Ameet Bagwe and Rubin A. Parekhji}, title = {Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems}, booktitle = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei, Taiwan}, pages = {260}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/ATS.2000.893635}, doi = {10.1109/ATS.2000.893635}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/BagweP00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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