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BibTeX record conf/ats/Altaf-Ul-AminOF01
@inproceedings{DBLP:conf/ats/Altaf-Ul-AminOF01, author = {Md. Altaf{-}Ul{-}Amin and Satoshi Ohtake and Hideo Fujiwara}, title = {Design for Hierarchical Two-Pattern Testability of Data Paths}, booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto, Japan}, pages = {11--16}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/ATS.2001.990251}, doi = {10.1109/ATS.2001.990251}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/Altaf-Ul-AminOF01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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