Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces.

Zaid Al-Ars A. J. van de Goor Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces. 24-27 2003 conf/ats/2003 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510024abs.htm db/conf/ats/ats2003.html#Al-ArsG03