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BibTeX record conf/ats/AhlawatVTS17
@inproceedings{DBLP:conf/ats/AhlawatVTS17, author = {Satyadev Ahlawat and Darshit Vaghani and Jaynarayan T. Tudu and Virendra Singh}, title = {On Securing Scan Design from Scan-Based Side-Channel Attacks}, booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan, November 27-30, 2017}, pages = {58--63}, publisher = {{IEEE} Computer Society}, year = {2017}, url = {https://doi.org/10.1109/ATS.2017.23}, doi = {10.1109/ATS.2017.23}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/AhlawatVTS17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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