BibTeX record conf/ats/AhlawatTMS15

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@inproceedings{DBLP:conf/ats/AhlawatTMS15,
  author       = {Satyadev Ahlawat and
                  Jaynarayan T. Tudu and
                  Anzhela Yu. Matrosova and
                  Virendra Singh},
  title        = {A New Scan Flip Flop Design to Eliminate Performance Penalty of Scan},
  booktitle    = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
                  22-25, 2015},
  pages        = {25--30},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/ATS.2015.12},
  doi          = {10.1109/ATS.2015.12},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/AhlawatTMS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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