Agarwal97'

BibTeX

@inproceedings{DBLP:conf/ats/Agarwal97,
  author    = {Vinod K. Agarwal},
  title     = {Embedded Test and Measurement Critical for Deep Submicron
               Technology},
  booktitle = {Asian Test Symposium},
  year      = {1997},
  pages     = {2-},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090002.pdf},
  crossref  = {DBLP:conf/ats/1997},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1997,
  title     = {6th Asian Test Symposium (ATS '97), 17-18 November 1997,
               Akita, Japan},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1997},
  isbn      = {0-8186-8209-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}