BibTeX record conf/ats/AddepalliPANSV22

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@inproceedings{DBLP:conf/ats/AddepalliPANSV22,
  author       = {Hari Addepalli and
                  Irith Pomeranz and
                  M. Enamul Amyeen and
                  Suriyaprakash Natarajan and
                  Arani Sinha and
                  Srikanth Venkataraman},
  title        = {Using Fault Detection Tests to Produce Diagnostic Tests Targeting
                  Large Sets of Candidate Faults},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {120--125},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00033},
  doi          = {10.1109/ATS56056.2022.00033},
  timestamp    = {Wed, 11 Jan 2023 15:00:17 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/AddepalliPANSV22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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