BibTeX record conf/ats/0010SKHW18

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@inproceedings{DBLP:conf/ats/0010SKHW18,
  author       = {Chang Liu and
                  Eric Schneider and
                  Matthias Kampmann and
                  Sybille Hellebrand and
                  Hans{-}Joachim Wunderlich},
  title        = {Extending Aging Monitors for Early Life and Wear-Out Failure Prevention},
  booktitle    = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
                  15-18, 2018},
  pages        = {92--97},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ATS.2018.00028},
  doi          = {10.1109/ATS.2018.00028},
  timestamp    = {Sat, 30 Sep 2023 09:34:54 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/0010SKHW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}