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BibTeX record conf/ats/0010SKHW18
@inproceedings{DBLP:conf/ats/0010SKHW18, author = {Chang Liu and Eric Schneider and Matthias Kampmann and Sybille Hellebrand and Hans{-}Joachim Wunderlich}, title = {Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October 15-18, 2018}, pages = {92--97}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ATS.2018.00028}, doi = {10.1109/ATS.2018.00028}, timestamp = {Sat, 30 Sep 2023 09:34:54 +0200}, biburl = {https://dblp.org/rec/conf/ats/0010SKHW18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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