BibTeX record conf/asscc/UemuraKF19

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@inproceedings{DBLP:conf/asscc/UemuraKF19,
  author       = {Toshifumi Uemura and
                  Yuko Kitaji and
                  Kazuki Fukuoka},
  title        = {A 28nm fully digital voltage monitor with 16.5uV/{\textdegree}C accuracy
                  and 0.8mV quantized error from -40 to 160{\textdegree}C for {ISO26262}
                  {ASIL-D} capable {MCU}},
  booktitle    = {{IEEE} Asian Solid-State Circuits Conference, {A-SSCC} 2019, Macau,
                  SAR, China, November 4-6, 2019},
  pages        = {129--132},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/A-SSCC47793.2019.9056911},
  doi          = {10.1109/A-SSCC47793.2019.9056911},
  timestamp    = {Sun, 19 Apr 2020 18:10:17 +0200},
  biburl       = {https://dblp.org/rec/conf/asscc/UemuraKF19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}