BibTeX record conf/asscc/OhHSCKK21

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@inproceedings{DBLP:conf/asscc/OhHSCKK21,
  author       = {Ghil{-}Geun Oh and
                  Min{-}Hye Ho and
                  Yeon{-}Jung Shin and
                  Jaewook Choi and
                  Ju{-}Youn Kim and
                  Young{-}Dae Kim},
  title        = {Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device
                  Reliability Issues in Advanced Technology Nodes},
  booktitle    = {{IEEE} Asian Solid-State Circuits Conference, {A-SSCC} 2021, Busan,
                  Korea, Republic of, November 7-10, 2021},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/A-SSCC53895.2021.9634812},
  doi          = {10.1109/A-SSCC53895.2021.9634812},
  timestamp    = {Tue, 21 Dec 2021 17:54:16 +0100},
  biburl       = {https://dblp.org/rec/conf/asscc/OhHSCKK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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