A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults.

Fei Wang Yu Hu Huawei Li Xiaowei Li A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults. 571-576 2008 ASP-DAC http://dx.doi.org/10.1109/ASPDAC.2008.4484017 conf/aspdac/2008 db/conf/aspdac/aspdac2008.html#WangHLL08