BibTeX
@inproceedings{DBLP:conf/aspdac/WangHLL08,
author = {Fei Wang and
Yu Hu and
Huawei Li and
Xiaowei Li},
title = {A design- for-diagnosis technique for diagnosing both scan
chain faults and combinational circuit faults},
booktitle = {ASP-DAC},
year = {2008},
pages = {571-576},
ee = {http://dx.doi.org/10.1109/ASPDAC.2008.4484017},
crossref = {DBLP:conf/aspdac/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/aspdac/2008,
title = {Proceedings of the 13th Asia South Pacific Design Automation
Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
booktitle = {ASP-DAC},
publisher = {IEEE},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-05-06 by Michael Ley (ley@uni-trier.de)