BibTeX record conf/aspdac/ShintaniS13

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@inproceedings{DBLP:conf/aspdac/ShintaniS13,
  author       = {Michihiro Shintani and
                  Takashi Sato},
  title        = {An adaptive current-threshold determination for {IDDQ} testing based
                  on Bayesian process parameter estimation},
  booktitle    = {18th Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2013, Yokohama, Japan, January 22-25, 2013},
  pages        = {614--619},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/ASPDAC.2013.6509666},
  doi          = {10.1109/ASPDAC.2013.6509666},
  timestamp    = {Mon, 17 Jun 2024 15:19:47 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/ShintaniS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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