BibTeX record conf/aspdac/ShiT98

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@inproceedings{DBLP:conf/aspdac/ShiT98,
  author       = {Chuanjin Richard Shi and
                  Michael W. Tian},
  title        = {Automatic Test Generation for Linear Analog Circuits under Parameter
                  Variations},
  booktitle    = {Proceedings of the {ASP-DAC} '98, Asia and South Pacific Design Automation
                  Conference 1998, Pacifico Yokohama, Yokohama, Japan, February 10-13,
                  1998},
  pages        = {501--506},
  publisher    = {{IEEE}},
  year         = {1998},
  timestamp    = {Mon, 29 Jul 2024 12:23:02 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/ShiT98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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