BibTeX
@inproceedings{DBLP:conf/aspdac/NagataONMI01,
author = {Makoto Nagata and
Takafumi Ohmoto and
Jin Nagai and
Takashi Morie and
Atsushi Iwata},
title = {Test circuits for substrate noise evaluation in CMOS digital
ICs},
booktitle = {ASP-DAC},
year = {2001},
pages = {13-14},
ee = {http://doi.acm.org/10.1145/370155.370209},
crossref = {DBLP:conf/aspdac/2001},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/aspdac/2001,
title = {Proceedings of ASP-DAC 2001, Asia and South Pacific Design
Automation Conference 2001, January 30-February 2, 2001,
Yokohama, Japan},
booktitle = {ASP-DAC},
publisher = {ACM},
year = {2001},
isbn = {0-7803-6634-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-02-10 by Michael Ley (ley@uni-trier.de)