BibTeX record conf/aspdac/NagataONMI01

download as .bib file

@inproceedings{DBLP:conf/aspdac/NagataONMI01,
  author       = {Makoto Nagata and
                  Takafumi Ohmoto and
                  Jin Nagai and
                  Takashi Morie and
                  Atsushi Iwata},
  editor       = {Satoshi Goto},
  title        = {Test circuits for substrate noise evaluation in {CMOS} digital ICs},
  booktitle    = {Proceedings of {ASP-DAC} 2001, Asia and South Pacific Design Automation
                  Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
  pages        = {13--14},
  publisher    = {{ACM}},
  year         = {2001},
  url          = {https://doi.org/10.1145/370155.370209},
  doi          = {10.1145/370155.370209},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/NagataONMI01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.