BibTeX record conf/aspdac/MatsunawaYP16

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@inproceedings{DBLP:conf/aspdac/MatsunawaYP16,
  author       = {Tetsuaki Matsunawa and
                  Bei Yu and
                  David Z. Pan},
  title        = {Laplacian eigenmaps and bayesian clustering based layout pattern sampling
                  and its applications to hotspot detection and {OPC}},
  booktitle    = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2016, Macao, Macao, January 25-28, 2016},
  pages        = {679--684},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ASPDAC.2016.7428090},
  doi          = {10.1109/ASPDAC.2016.7428090},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/MatsunawaYP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}