BibTeX record conf/aspdac/LiuXCM17

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@inproceedings{DBLP:conf/aspdac/LiuXCM17,
  author       = {Shanshan Liu and
                  Liyi Xiao and
                  Xuebing Cao and
                  Zhigang Mao},
  title        = {Reliability analysis of memories suffering MBUs for the effect of
                  negative bias temperature instability},
  booktitle    = {22nd Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2017, Chiba, Japan, January 16-19, 2017},
  pages        = {87--92},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ASPDAC.2017.7858301},
  doi          = {10.1109/ASPDAC.2017.7858301},
  timestamp    = {Wed, 10 May 2023 21:51:47 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/LiuXCM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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