On reducing both shift and capture power for scan-based testing.

Jia Li Qiang Xu Yu Hu Xiaowei Li On reducing both shift and capture power for scan-based testing. 653-658 2008 ASP-DAC http://dx.doi.org/10.1109/ASPDAC.2008.4484032 conf/aspdac/2008 db/conf/aspdac/aspdac2008.html#LiXHL08