BibTeX record conf/aspdac/LiHLH15

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@inproceedings{DBLP:conf/aspdac/LiHLH15,
  author       = {Liang{-}Che Li and
                  Wen{-}Hsuan Hsu and
                  Kuen{-}Jong Lee and
                  Chun{-}Lung Hsu},
  title        = {An efficient 3D-IC on-chip test framework to embed {TSV} testing in
                  memory {BIST}},
  booktitle    = {The 20th Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2015, Chiba, Japan, January 19-22, 2015},
  pages        = {520--525},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ASPDAC.2015.7059059},
  doi          = {10.1109/ASPDAC.2015.7059059},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/LiHLH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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