Kunhyuk Kang Saakshi Gangwal Sang Phill Park Kaushik Roy NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? 726-731 2008 ASP-DAC http://dx.doi.org/10.1109/ASPDAC.2008.4484047 conf/aspdac/2008 db/conf/aspdac/aspdac2008.html#KangGPR08