Test data compression technique using selective don't-care identification.

Terumine Hayashi Haruna Yoshioka Tsuyoshi Shinogi Hidehiko Kita Haruhiko Takase Test data compression technique using selective don't-care identification. 230-233 2004 conf/aspdac/2004 ASP-DAC http://doi.acm.org/10.1145/1015090.1015144 db/conf/aspdac/aspdac2004.html#HayashiYSKT04