BibTeX record conf/aspdac/HayashiYSKT04

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@inproceedings{DBLP:conf/aspdac/HayashiYSKT04,
  author       = {Terumine Hayashi and
                  Haruna Yoshioka and
                  Tsuyoshi Shinogi and
                  Hidehiko Kita and
                  Haruhiko Takase},
  editor       = {Masaharu Imai},
  title        = {Test data compression technique using selective don't-care identification},
  booktitle    = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation:
                  Electronic Design and Solution Fair 2004, Yokohama, Japan, January
                  27-30, 2004},
  pages        = {230--233},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.191},
  doi          = {10.1109/ASPDAC.2004.191},
  timestamp    = {Thu, 23 Mar 2023 23:58:21 +0100},
  biburl       = {https://dblp.org/rec/conf/aspdac/HayashiYSKT04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}