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BibTeX record conf/aspdac/HayashiYSKT04
@inproceedings{DBLP:conf/aspdac/HayashiYSKT04, author = {Terumine Hayashi and Haruna Yoshioka and Tsuyoshi Shinogi and Hidehiko Kita and Haruhiko Takase}, editor = {Masaharu Imai}, title = {Test data compression technique using selective don't-care identification}, booktitle = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004}, pages = {230--233}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.191}, doi = {10.1109/ASPDAC.2004.191}, timestamp = {Thu, 23 Mar 2023 23:58:21 +0100}, biburl = {https://dblp.org/rec/conf/aspdac/HayashiYSKT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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