HayashiYSKT04'

BibTeX

@inproceedings{DBLP:conf/aspdac/HayashiYSKT04,
  author    = {Terumine Hayashi and
               Haruna Yoshioka and
               Tsuyoshi Shinogi and
               Hidehiko Kita and
               Haruhiko Takase},
  title     = {Test data compression technique using selective don't-care
               identification},
  booktitle = {ASP-DAC},
  year      = {2004},
  pages     = {230-233},
  ee        = {http://doi.acm.org/10.1145/1015090.1015144},
  crossref  = {DBLP:conf/aspdac/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/aspdac/2004,
  editor    = {Masaharu Imai},
  title     = {Proceedings of the 2004 Conference on Asia South Pacific
               Design Automation: Electronic Design and Solution Fair 2004,
               Yokohama, Japan, January 27-30, 2004},
  booktitle = {ASP-DAC},
  publisher = {IEEE},
  year      = {2004},
  isbn      = {0-7803-8175-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}