BibTeX record: conf/aspdac/FukunagaKWMHS06

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@inproceedings{DBLP:conf/aspdac/FukunagaKWMHS06,
  author    = {Masayasu Fukunaga and
               Seiji Kajihara and
               Xiaoqing Wen and
               Toshiyuki Maeda and
               Shuji Hamada and
               Yasuo Sato},
  title     = {A dynamic test compaction procedure for high-quality path delay testing.},
  booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
               {ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
  year      = {2006},
  pages     = {348--353},
  crossref  = {DBLP:conf/aspdac/2006},
  url       = {http://doi.acm.org/10.1145/1118299.1118388},
  doi       = {10.1145/1118299.1118388},
  timestamp = {Wed, 03 Sep 2014 06:55:07 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/aspdac/FukunagaKWMHS06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2006,
  editor    = {Fumiyasu Hirose},
  title     = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
               {ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
  year      = {2006},
  publisher = {{IEEE}},
  isbn      = {0-7803-9451-8},
  timestamp = {Wed, 03 Sep 2014 06:55:07 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/aspdac/2006},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}