Hideo Fujiwara Marie Engelene J. Obien Secure and testable scan design using extended de Bruijn graphs. 413-418 2010 ASP-DAC http://dx.doi.org/10.1109/ASPDAC.2010.5419845 conf/aspdac/2010 db/conf/aspdac/aspdac2010.html#FujiwaraO10