BibTeX
@inproceedings{DBLP:conf/aspdac/FuLHL08,
author = {Xiang Fu and
Huawei Li and
Yu Hu and
Xiaowei Li},
title = {Robust test generation for power supply noise induced path
delay faults},
booktitle = {ASP-DAC},
year = {2008},
pages = {659-662},
ee = {http://dx.doi.org/10.1109/ASPDAC.2008.4484033},
crossref = {DBLP:conf/aspdac/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/aspdac/2008,
title = {Proceedings of the 13th Asia South Pacific Design Automation
Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
booktitle = {ASP-DAC},
publisher = {IEEE},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-05-06 by Michael Ley (ley@uni-trier.de)