Yasumi Doi Seiji Kajihara Xiaoqing Wen Lei Li Krishnendu Chakrabarty Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. 59-64 2005 conf/aspdac/2005 ASP-DAC http://doi.acm.org/10.1145/1120725.1120744 db/conf/aspdac/aspdac2005.html#DoiKWLC05