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BibTeX record conf/aspdac/ChenYX09
@inproceedings{DBLP:conf/aspdac/ChenYX09, author = {Zhen Chen and Boxue Yin and Dong Xiang}, editor = {Kazutoshi Wakabayashi}, title = {Conflict driven scan chain configuration for high transition fault coverage and low test power}, booktitle = {Proceedings of the 14th Asia South Pacific Design Automation Conference, {ASP-DAC} 2009, Yokohama, Japan, January 19-22, 2009}, pages = {666--671}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/ASPDAC.2009.4796556}, doi = {10.1109/ASPDAC.2009.4796556}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/aspdac/ChenYX09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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