BibTeX record conf/aspdac/Chandrasekharan18

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@inproceedings{DBLP:conf/aspdac/Chandrasekharan18,
  author       = {Arun Chandrasekharan and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  Daniel Gro{\ss}e and
                  Rolf Drechsler},
  editor       = {Youngsoo Shin},
  title        = {Approximation-aware testing for approximate circuits},
  booktitle    = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
                  2018, Jeju, Korea (South), January 22-25, 2018},
  pages        = {239--244},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ASPDAC.2018.8297312},
  doi          = {10.1109/ASPDAC.2018.8297312},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/Chandrasekharan18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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