David Atienza Giovanni De Micheli Luca Benini José L. Ayala Pablo Garcia Del Valle Michael DeBole Vijay Narayanan Reliability-aware design for nanometer-scale devices. 549-554 2008 ASP-DAC http://dx.doi.org/10.1109/ASPDAC.2008.4484011 conf/aspdac/2008 db/conf/aspdac/aspdac2008.html#AtienzaMBAVDN08