BibTeX
@inproceedings{DBLP:conf/aspdac/AtienzaMBAVDN08,
author = {David Atienza and
Giovanni De Micheli and
Luca Benini and
Jos{\'e} L. Ayala and
Pablo Garcia Del Valle and
Michael DeBole and
Vijay Narayanan},
title = {Reliability-aware design for nanometer-scale devices},
booktitle = {ASP-DAC},
year = {2008},
pages = {549-554},
ee = {http://dx.doi.org/10.1109/ASPDAC.2008.4484011},
crossref = {DBLP:conf/aspdac/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/aspdac/2008,
title = {Proceedings of the 13th Asia South Pacific Design Automation
Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
booktitle = {ASP-DAC},
publisher = {IEEE},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-05-06 by Michael Ley (ley@uni-trier.de)