AokiTIF95'

@inproceedings{DBLP:conf/aspdac/AokiTIF95,
  author    = {Takashi Aoki and
               Tomoji Toriyama and
               Kenji Ishikawa and
               Kennosuke Fukami},
  title     = {A tool for measuring quality of test pattern for LSIs' functional
               design},
  booktitle = {ASP-DAC},
  year      = {1995},
  ee        = {http://dx.doi.org/10.1145/224818.224956},
  crossref  = {DBLP:conf/aspdac/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/aspdac/1995,
  editor    = {Isao Shirakawa},
  title     = {Proceedings of the 1995 Conference on Asia Pacific Design
               Automation, Makuhari, Massa, Chiba, Japan, August 29 - September
               1, 1995},
  booktitle = {ASP-DAC},
  publisher = {ACM},
  year      = {1995},
  isbn      = {0-89791-766-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}