BibTeX record conf/aspdac/AokiTIF95

download as .bib file

@inproceedings{DBLP:conf/aspdac/AokiTIF95,
  author       = {Takashi Aoki and
                  Tomoji Toriyama and
                  Kenji Ishikawa and
                  Kennosuke Fukami},
  editor       = {Isao Shirakawa},
  title        = {A tool for measuring quality of test pattern for LSIs' functional
                  design},
  booktitle    = {Proceedings of the 1995 Conference on Asia Pacific Design Automation,
                  Makuhari, Massa, Chiba, Japan, August 29 - September 1, 1995},
  publisher    = {{ACM}},
  year         = {1995},
  url          = {https://doi.org/10.1145/224818.224956},
  doi          = {10.1145/224818.224956},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/AokiTIF95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.