BibTeX record conf/asicon/ZhangDJZ17

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@inproceedings{DBLP:conf/asicon/ZhangDJZ17,
  author       = {Jianfu Zhang and
                  Meng Duan and
                  Zhigang Ji and
                  Weidong Zhang},
  editor       = {Yajie Qin and
                  Zhiliang Hong and
                  Ting{-}Ao Tang},
  title        = {Hot carrier aging of nano-scale devices: Characterization method,
                  statistical variation, and their impact on use voltage},
  booktitle    = {12th {IEEE} International Conference on ASIC, {ASICON} 2017, Guiyang,
                  China, October 25-28, 2017},
  pages        = {670--673},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ASICON.2017.8252564},
  doi          = {10.1109/ASICON.2017.8252564},
  timestamp    = {Tue, 29 Dec 2020 18:39:26 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/ZhangDJZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}