BibTeX record conf/asicon/YangLDXXLLL19

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@inproceedings{DBLP:conf/asicon/YangLDXXLLL19,
  author       = {Jianguo Yang and
                  Xiaowen Li and
                  Qingting Ding and
                  Xiaoyong Xue and
                  Xiaoxin Xu and
                  Qing Luo and
                  Hangbing Lv and
                  Ming Liu},
  title        = {A High Reliability 500 {\(\mathrm{\mu}\)}W Resistance-to-Digital Interface
                  Circuit for SnO2 Gas Sensor IoT Applications},
  booktitle    = {13th {IEEE} International Conference on ASIC, {ASICON} 2019, Chongqing,
                  China, October 29 - November 1, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ASICON47005.2019.8983585},
  doi          = {10.1109/ASICON47005.2019.8983585},
  timestamp    = {Wed, 12 Feb 2020 16:13:42 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/YangLDXXLLL19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}