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BibTeX record conf/asicon/MaXWC19
@inproceedings{DBLP:conf/asicon/MaXWC19, author = {Jingrui Ma and Qi{-}An Xu and Blacksmith Wu and Kanyu Cao}, title = {Improved Model for {ESD} Failure Caused by Stressing No Connect Pin}, booktitle = {13th {IEEE} International Conference on ASIC, {ASICON} 2019, Chongqing, China, October 29 - November 1, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ASICON47005.2019.8983554}, doi = {10.1109/ASICON47005.2019.8983554}, timestamp = {Sun, 25 Oct 2020 23:10:06 +0100}, biburl = {https://dblp.org/rec/conf/asicon/MaXWC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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