HanTGF05'

BibTeX

@inproceedings{DBLP:conf/asap/HanTGF05,
  author    = {Jie Han and
               Erin Taylor and
               Jianbo Gao and
               Jos{\'e} A. B. Fortes},
  title     = {Faults, Error Bounds and Reliability of Nanoelectronic Circuits},
  booktitle = {ASAP},
  year      = {2005},
  pages     = {247-253},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ASAP.2005.36},
  crossref  = {DBLP:conf/asap/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/asap/2005,
  title     = {16th IEEE International Conference on Application-Specific
               Systems, Architectures, and Processors (ASAP 2005), 23-25
               July 2005, Samos, Greece},
  booktitle = {ASAP},
  publisher = {IEEE Computer Society},
  year      = {2005},
  isbn      = {0-7695-2407-9},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}