Generation of New March Tests with Low Test Power and High Fault Coverage by Test Sequence Reordering Using Genetic Algorithm.

C. V. Gayathri N. Kayalvizhi M. Mallikadevi Generation of New March Tests with Low Test Power and High Fault Coverage by Test Sequence Reordering Using Genetic Algorithm. 699-703 2009 ARTCom http://doi.ieeecomputersociety.org/10.1109/ARTCom.2009.52 conf/artcom/2009 db/conf/artcom/artcom2009.html#GayathriKM09