BibTeX record conf/apsec/ChenLLT18

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@inproceedings{DBLP:conf/apsec/ChenLLT18,
  author       = {Woei{-}Kae Chen and
                  Chien{-}Hung Liu and
                  William W.{-}Y. Liang and
                  Ming{-}Yi Tsai},
  title        = {{ICAT:} An IoT Device Compatibility Testing Tool},
  booktitle    = {25th Asia-Pacific Software Engineering Conference, {APSEC} 2018, Nara,
                  Japan, December 4-7, 2018},
  pages        = {668--672},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/APSEC.2018.00087},
  doi          = {10.1109/APSEC.2018.00087},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/apsec/ChenLLT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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