BibTeX record conf/apccas/ChuangWHHCH12

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@inproceedings{DBLP:conf/apccas/ChuangWHHCH12,
  author       = {Chung Chuang and
                  Chun{-}Yen Wu and
                  Chi{-}Chun Hsu and
                  Li{-}Ren Huang and
                  Wei{-}Min Cheng and
                  Wen{-}Dar Hsieh},
  title        = {A design for testability of non-volatile memory reliability test for
                  automotive embedded processor},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2012,
                  Kaohsiung, Taiwan, December 2-5, 2012},
  pages        = {372--375},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/APCCAS.2012.6419049},
  doi          = {10.1109/APCCAS.2012.6419049},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/apccas/ChuangWHHCH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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