BibTeX record conf/apccas/ChenZWKXPMQZ22

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@inproceedings{DBLP:conf/apccas/ChenZWKXPMQZ22,
  author       = {Langtao Chen and
                  Xin Zhou and
                  Ying Wang and
                  Ying Kong and
                  Rubin Xie and
                  Ling Peng and
                  Yantu Mo and
                  Ming Qiao and
                  Bo Zhang},
  title        = {Study on Single Event Burnout Effect for 18V {LDMOS} Based on 0.18{\(\mathrm{\mu}\)}m
                  Process Technology},
  booktitle    = {{IEEE} Asia Pacific Conference on Circuit and Systems, {APCCAS} 2022,
                  Shenzhen, China, November 11-13, 2022},
  pages        = {588--591},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/APCCAS55924.2022.10090399},
  doi          = {10.1109/APCCAS55924.2022.10090399},
  timestamp    = {Sat, 22 Apr 2023 16:25:51 +0200},
  biburl       = {https://dblp.org/rec/conf/apccas/ChenZWKXPMQZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}