Early estimation of defect density using an in-process Haskell metrics model.

Mark Sherriff Nachiappan Nagappan Laurie A. Williams Mladen A. Vouk Early estimation of defect density using an in-process Haskell metrics model. 2005 conf/amost/2005 A-MOST http://doi.acm.org/10.1145/1083274.1083285 db/conf/amost/amost2005.html#SherriffNWV05