Closing the Defect Reduction Gap Between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative Test-First Programming.

Jerod Wilkerson Closing the Defect Reduction Gap Between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative Test-First Programming. 389 2007 AMCIS http://aisel.aisnet.org/amcis2007/389 conf/amcis/2007 db/conf/amcis/amcis2007.html#Wilkerson07