BibTeX record conf/amcis/Wilkerson07

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@inproceedings{DBLP:conf/amcis/Wilkerson07,
  author       = {Jerod W. Wilkerson},
  editor       = {John A. Hoxmeier and
                  Stephen C. Hayne},
  title        = {Closing the Defect Reduction Gap Between Software Inspection and Test-Driven
                  Development: Applying Mutation Analysis to Iterative Test-First Programming},
  booktitle    = {Reaching New Heights. 13th Americas Conference on Information Systems,
                  {AMCIS} 2007, Keystone, Colorado, USA, August 9-12, 2007},
  pages        = {389},
  publisher    = {Association for Information Systems},
  year         = {2007},
  url          = {http://aisel.aisnet.org/amcis2007/389},
  timestamp    = {Sun, 05 Sep 2021 01:16:50 +0200},
  biburl       = {https://dblp.org/rec/conf/amcis/Wilkerson07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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