BibTeX record conf/amcc/YangTZGZZF21

download as .bib file

@inproceedings{DBLP:conf/amcc/YangTZGZZF21,
  author       = {Chun Yang and
                  Lujing Tao and
                  Jian Zhang and
                  Xingtai Gui and
                  Jiyang Zhang and
                  Jianxiao Zou and
                  Shicai Fan},
  title        = {A Fault Detection Method based on the Deep Extended {PCA} - {SVM}
                  in Industrial Processes},
  booktitle    = {2021 American Control Conference, {ACC} 2021, New Orleans, LA, USA,
                  May 25-28, 2021},
  pages        = {3620--3625},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.23919/ACC50511.2021.9482824},
  doi          = {10.23919/ACC50511.2021.9482824},
  timestamp    = {Fri, 30 Jul 2021 11:11:53 +0200},
  biburl       = {https://dblp.org/rec/conf/amcc/YangTZGZZF21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.