BibTeX record conf/amcc/ChangNLA21

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@inproceedings{DBLP:conf/amcc/ChangNLA21,
  author       = {Yuhe Chang and
                  William S. Nagel and
                  Kam K. Leang and
                  Sean B. Andersson},
  title        = {Comparison of Two Optimization-Based Controllers for Feature Tracking
                  {SPM} Scanning in Dual-Stage Nanopositioners},
  booktitle    = {2021 American Control Conference, {ACC} 2021, New Orleans, LA, USA,
                  May 25-28, 2021},
  pages        = {4315--4320},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.23919/ACC50511.2021.9483306},
  doi          = {10.23919/ACC50511.2021.9483306},
  timestamp    = {Fri, 30 Jul 2021 11:11:53 +0200},
  biburl       = {https://dblp.org/rec/conf/amcc/ChangNLA21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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