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BibTeX record conf/aitest/LinL20
@inproceedings{DBLP:conf/aitest/LinL20, author = {Hsien{-}I Lin and Po{-}Yi Lin}, title = {An Image Quality Assessment Method for Surface Defect Inspection}, booktitle = {{IEEE} International Conference On Artificial Intelligence Testing, AITest 2020, Oxford, UK, August 3-6, 2020}, pages = {1--6}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/AITEST49225.2020.00008}, doi = {10.1109/AITEST49225.2020.00008}, timestamp = {Sun, 02 Oct 2022 15:54:22 +0200}, biburl = {https://dblp.org/rec/conf/aitest/LinL20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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