BibTeX record conf/aitest/AribiLLLM19

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@inproceedings{DBLP:conf/aitest/AribiLLLM19,
  author       = {Noureddine Aribi and
                  Nadjib Lazaar and
                  Yahia Lebbah and
                  Samir Loudni and
                  Mehdi Maamar},
  title        = {A Multiple Fault Localization Approach Based on Multicriteria Analytical
                  Hierarchy Process},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2019, Newark, CA, USA, April 4-9, 2019},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/AITest.2019.00-16},
  doi          = {10.1109/AITEST.2019.00-16},
  timestamp    = {Tue, 21 Mar 2023 21:03:31 +0100},
  biburl       = {https://dblp.org/rec/conf/aitest/AribiLLLM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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