BibTeX record conf/aina/MullnerT11

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@inproceedings{DBLP:conf/aina/MullnerT11,
  author    = {Nils M{\"{u}}llner and
               Oliver E. Theel},
  title     = {The Degree of Masking Fault Tolerance vs. Temporal Redundancy},
  booktitle = {25th {IEEE} International Conference on Advanced Information Networking
               and Applications Workshops, {WAINA} 2011, Biopolis, Singapore, March
               22-25, 2011},
  pages     = {21--28},
  year      = {2011},
  crossref  = {DBLP:conf/aina/2011w},
  url       = {https://doi.org/10.1109/WAINA.2011.137},
  doi       = {10.1109/WAINA.2011.137},
  timestamp = {Sun, 21 May 2017 00:17:33 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aina/MullnerT11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aina/2011w,
  title     = {25th {IEEE} International Conference on Advanced Information Networking
               and Applications Workshops, {WAINA} 2011, Biopolis, Singapore, March
               22-25, 2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5762827},
  isbn      = {978-0-7695-4338-3},
  timestamp = {Mon, 15 Sep 2014 17:23:22 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aina/2011w},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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